ICSPI – Redux AFM
Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux AFM. Get quantitative data in minutes for topography, roughness, film thickness, particle size and more.
Revolutionary AFM-on-a-Chip Technology Simplifies Traditional AFM Processes
Traditional AFM instruments, while powerful for nanoscale surface imaging, are often hindered by complex and time-consuming setup processes rooted in technology developed in the 1980s. Recognizing this challenge, ICSPI revolutionized the landscape with its unique AFM-on-a-chip technology. The Redux AFM, harnessing this breakthrough technology, makes nanoscale imaging effortless. By integrating multiple components onto a single chip, the Redux eliminates the cumbersome aspects of traditional AFM, such as silicon probe exchange, cantilever alignment, tip crashes, tip-sample approach, and controller tuning.
Technical Specifications
| AFM Specifications | |
| Sensing | Self-sensing, laser alignment-free |
| Z actuation | Self-actuating |
| XY actuation | Electrothermal |
| Max scan area (XY) | 20 μm x 20 μm |
| Z Range | 20 μm |
| Sample | |
| Max sample height | 20 mm |
| Max sample weight | 250 g |
| Integrated Optical Microscope | |
| Objective | 10x, 0.25 NA |
| Field of view | 1.4 mm × 0.8 mm |
| Resolution | 1920 x 1080 FHD video output |
| System Dimensions | |
| Dimensions (L x W x H) | 23.2 cm × 22.0 cm × 24.6 cm |
| Weight | 4 kg |
| Software and I/O | |
| Communication | USB |
| Operating System | Windows 10, 11 |
| Power | |
| Power supply | Class II (two prong) |
| Input | 100-240 VAC ~ 50/60 Hz |
| Output | 12 VDC, 3 A |
Key Features
- Precise: Quantitative 3D data with sub-nanometer precision
- Automated: Motorized X, Y and Z stages for easy sample navigation
- High throughput: Go from sample loading to data in minutes
- Versatile: Topography, roughness, thickness, particle size and more
Automated
- One-click configuration
- One-click automatic approach in seconds
- Laser alignment-free operation
Unlike traditional AFMs, the Redux has no laser alignment step or manual approach: an integrated sensor on the AFM chip automates everything for you.
Compatible with your sample
- Opaque or transparent, conductive or non-conductive samples
- Minimal to no sample preparation and non-destructive scanning
- Generous sample platform (125 mm x 100 mm) and height (20 mm)
The Redux is compatible with virtually any solid sample, including adhesive samples.
Ultra-durable probes
- Extremely low tapping force
- Easy handling
- Laser alignment-free operation
Our unique AFM chips have durable probes that last hundreds of scans without noticeable wear. The AFM chips are mounted onto easy-to-handle printed circuit boards (PCBs) that can even be handled by hand.
Solutions
Redux AFM: Automated Atomic Force Microscope
ICSPI develops and produces easy to use and affordable benchtop AFM instruments designed for the individual scientist and individual lab…
