Mahr – MarSurf – PC-Based Roughness Measuring Units
Technical innovation and quality-oriented thinking are the core competencies of successful businesses.
Both competencies are not possible without metrology.
Measurement instruments verify research and development results and document product quality. Without continuous advancement of metrology there would be no technical progress.
Mahr offers a wide range of measuring instruments to solve your specific measuring task. Convince yourself!
Available Models
Technical Specifications
| Measuring principle | Stylus method | |
|---|---|---|
| Probe | BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit | |
| Measuring range mm | +/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system 350 µm applies to PHT probe system | |
| Filter according to ISO/JIS | filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31 | |
| Traversing lengths | MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm, Measurement up to stop, variable | |
| Number n of sampling length according to ISO/JIS | 1 to 50 (default: 5) | |
| Measuring force (N) | 0,7 mN | |
| Surface parameters | Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085) | |
| * Traversing length dependent on drive unit | ||
- Ideal instrument for a low cost introduction to user friendly surface metrology
- PC based instrument delivers all common surface parameters and profiles in accordance with international standards (both in measuring room and in production)
- Over 80 surface parameters for R , P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
- Bandpass filter Ls in accordance with current standard
- – Ls can be switched off or varied as required
- Comprehensive measuring records
- Internal program assistance for quick and easy measurements
- Automatic functions for choosing cut-off and traversing length in accordance with international standards
- Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
- Adjustable maintenance and calibration intervals
- Multiple measuring station configurations for custom applications
- Range of options provide system flexibility
- Various user levels protect the device against misuse and prevent unauthorized use
Technical Specifications
| Measuring principle | Stylus method | |
|---|---|---|
| Probe | R probe, MFW 250 B | |
| Measuring range mm | MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin) | |
| Traversing lengths | Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm*, Measurement up to stop, variable | |
| Number n of sampling length according to ISO/JIS | 1 to 50 (default: 5) | |
| Surface parameters | Over 100 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085) | |
| * Traversing length dependent on drive unit | ||
MarSurf XR 20, the perfect introduction to top-class surface metrology.
PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. The powerful MarSurf XR 20 combines decades of experience in surface metrology with innovative technology, easy to read icons and user friendly operator assistance.
- Over 100 surface parameters available for R, P and W profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
- Tolerance monitoring and statistics for all surface parameters
- Internal program assistance (Teach-in methods) for the rapid creation of Quick&Easy measuring programs
- Comprehensive measuring records
- Automatic functions for choosing filter and traversing length in accordance with international standards
- Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
- Adjustable maintenance and calibration intervals
- Simulation mode for rapid familiarization with operating principle
- Multiple measuring station configurations for custom applications
Technical Specifications
| Probe | R probe, MFW 250 Optical probe Focodyn*, LS 1*, LS 10* | |
|---|---|---|
| Measuring range mm | (in Z) 50 mm MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin) | |
| Traversing lengths | Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm, (.022 / .070 / .224 / .700 / 2.240 in), Measurement up to stop, variable | |
| Number n of sampling length according to ISO/JIS | 1 to 50 (default: 5) | |
| Measuring force (N) | 1 mN to 120 mN, below and above (can be set in MarSurf XC 20) | |
| *only in conjunction with PGK or GD 120 CNC drive unit | ||
Roughness and contour measurement at a measuring station with MarSurf XCR 20
Combined measuring station allows both surface roughness and contour measurements to be performed at a single measuring station. Depending on the measuring task, either the GD 25 drive unit for surface roughness measurements or the PCV drive unit for contour measurements can be activated.
The two measuring systems are fixed to the measuring stand by means of a combi holder.
- Space-saving design: the two drive units can be adapted by means of the corresponding combi holder to MarSurf ST 500 or ST 750 measuring stands
- Roughness and contour evaluation from a single measurement
- High precision contour and roughness evaluation for components requiring a long stroke and very high resolution with the MarSurf LD 130 / LD 260 measuring system
- Quick changeover between roughness and contour measurement simply by switching within the software platform and swapping mechanical components such as the drive unit and probe
Technical Specifications
| Resolution | 2 nm |
|---|---|
| Start of traversing length (in X) | 0.1 mm |
| End of traversing length (in X) | 130 mm |
| Positioning speed | 0.1 mm/s to 30 mm/s |
| Measuring speed | 0.1 mm/s to 5 mm/s; for roughness measurements 0.1 mm/s to 0.5 mm/s are recommended |
| Probe | Standard probe LP-D 14-10-2/60° |
| Measuring range mm | 10 mm (100 mm probe arm) 20 mm (200 mm probe arm) |
| Profile resolution | 2 nm |
| Traversing lengths | 0.1 mm to 130 mm |
| Measuring force (N) | 1 mN to 30 mN, software-adjustable |
MarSurf UD 130
Mahr replace with the MarSurf UD 130 the successful MarSurf UD 120 and closed the gap between the high end solution MarSurf LD 130/LD 260 and the standard combination measuring station MarSurf XCR 20 with two drive units.
The technical specification of the MarSurf UD 130 is far superior to that of the MarSurf UD 120: in particular, the measuring and positioning speeds have reduced the measuring time for each workpiece.
Technical Specifications
| Resolution | 0.8 nm |
|---|---|
| Start of traversing length (in X) | 0.1 mm |
| End of traversing length (in X) | 130 mm |
| Positioning speed | 0.02 mm/s to 200 mm/s |
| Measuring speed | 0.02 mm/s to 10 mm/s; for roughness measurements 0.1 mm/s to 0.5 mm/s is recommended |
| Measuring range mm | 13 mm (100 mm probe arm) 26 mm (200 mm probe arm) |
| Traversing lengths | 0.1 mm – 130 mm |
| Measuring force (N) | 0.5 mN to 30 mN, software-adjustable |
MarSurf LD 130 – A step into a new dimension
Combined contour and roughness measurements in just one step comes courtesy of proven cutting edge technology from Mahr metrology. The MarSurf LD 130 and MarSurf LD 260 measuring stations have been systematically developed to draw on the experience from the first generation of equipment.
- Roughness and contour in just one step
- High measuring and positioning speed cuts measuring times dramatically
- Innovative probe system removal
- Quick and reliable probe arm exchange with simultaneous probe arm detection by magnetic bracket
- Long measuring length up to 260 mm (MarSurf LD 260) with a measuring stroke of 13 mm (100 mm probe arm length) or 26 mm (200 mm probe arm length)
- Modular construction for ease of maintenance
- No need to fully dismantle the measuring stand for maintenance
Technical Specifications
| Measuring principle | Stylus method | |
|---|---|---|
| Probe | R probe, MFW 250 B | |
| Measuring range mm | MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin) | |
| Filter according to ISO/JIS | filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31 | |
| Traversing lengths | Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm*, Measurement up to stop, variable | |
| Number n of sampling length according to ISO/JIS | 1 to 50 (default: 5) | |
| Surface parameters | Over 100 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085) | |
| * Traversing length dependent on drive unit | ||
MarSurf XR 20, the perfect introduction to top-class surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. The powerful MarSurf XR 20 combines decades of experience in surface metrology with innovative technology, easy-to-read icons and user-friendly operator assistance.
A sampling length of up to 120 mm is possible in conjunction with the GD 120 drive unit.
In addition to surface roughness evaluations, profile and waviness evaluations can also be performed in this way.
- Over 100 surface parameters available for R, P and W profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
- Tolerance monitoring and statistics for all surface parameters
- Internal program assistance (Teach in methods) for the rapid creation of Quick&Easy measuring programs
- Comprehensive measuring records
- Automatic functions for choosing filter and traversing length in accordance with international standards
- Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
- Adjustable maintenance and calibration intervals
- Simulation mode for rapid familiarization with operating principle
- Multiple measuring station configurations for custom applications
Contour measuring in a new dimension
The new MarSurf CD series from Mahr sets new standards when it comes to contour testing. With the new MarSurf CD series, manufacturing companies are entering a new dimension in order to reliably secure and improve the manufacturing quality of workpieces in the measuring room or close to production.
The new measuring station concept combines speed, reliability and flexibility. The aim is to increase the profitability of the system for your company.
Innovative technologies:
- Fast axes
- Highly dynamic, intelligent probe system
- Innovative workpiece clamping system
Due to the combination of the measurement and evaluation system with the CD 120 feed unit, you can perform contour measurements within a measurement area up to 120 mm in length and 50 mm in height.
- With proven patented probe arm socket for easy exchange of application-specific probe arms
- Collision protection
- Gauging force adjustable from 2 mN to 120 mN
- Operation and positioning is controlled by a special measuring point view in the software
- Programmable measurement procedure
- Manual measuring stand consisting of an aluminium base plate 800 x 330 mm with 400 mm manual height adjustment
Key Industries
- Aerospace
- Automotive
- Die & Mould
- Energy
- Machinery & Manufacturing
- Railway
- Semiconductor, Solar & Electronics
- Shipbuilding
Brand
Mahr offers a wide range of measuring instruments to solve your specific measuring task. Mahr is an application specialist in the field of production metrology, which solves the metrological tasks and is the contact partner for all questions related to quality. The company offers solutions for high-precision metering to the manufacturers of the synthetic fibres, elastomeres and fiber reinforced composites, their suppliers and generally for the plastics processing industry.
Similar Products
