Helmut Fischer – Fischerscope X-ray XDV-µ
We have developed the FISCHERSCOPE® X-RAY XDV®-µ especially for measuring smallest structures and components with short measuring times. A large-area silicon drift detector and the polycapillary optics enable precise, repeata…
We have developed the FISCHERSCOPE® X-RAY XDV®-µ especially for measuring smallest structures and components with short measuring times. A large-area silicon drift detector and the polycapillary optics enable precise, repeatable measurements e.g. on bond surfaces, SMD components or thin wires. That permits precise quality monitoring of the coatings on printed circuit boards – and ensures their long-term function.
The FISCHERSCOPE® X-RAY XDV®-µ LD is your XRF instrument for the measurement of bulky samples. Due to the measuring distance of 12 mm, even assembled PCBs can be measured without any problems.
- Microfocus tube with tungsten anode; molybdenum anode optionally available
- Flexible, 4-fold exchangeable primary filter
- Polycapillary optics for particularly small measuring spots (10 – 60 µm FWHM) with short measuring times
- Silicon drift detector
- Video system with 3× optical zoom for precise sample positioning
- Precise, programmable measuring stage for automated measurements