Vaya improves current testing protocols—from low volume sampling to 100% ID testing— and if regulators require more testing in future, you can move to a higher-throughput process without any additional equipment. The system combines conventional Raman with unique spatially offset Raman spectroscopy (SORS) for maximum sample/container compatibility. With a dedicated raw material identity testing workflow, Vaya is fast, fully compliant, easy to deploy and simple to use, requiring minimal training or operator skill.

The LUMOS II takes FTIR microscopy to the next level by making it faster, easier, more accurate and reliable. We accomplished this by tailoring its software and user interface specifically to the user. Beginners get perfect results in no time, while experts are given almost unlimited possibilities. The LUMOS II offers exclusive FPA imaging technology, that naturally exceeds the speed and spatial resolution of line array and single-point measurements. Its applicability is enormous, the spectral data obtained always of the highest quality and the measurement times are very short.